학술논문

Experimental Analysis of Beam Perturbation in a Planar Crossed-Field Structure
Document Type
Periodical
Source
IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 51(8):2229-2236 Aug, 2023
Subject
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Anodes
Magnetic fields
Solid modeling
Current density
Electron beams
Stability criteria
Geometry
Beam instability
planar crossed field
tilted magnetic field
Language
ISSN
0093-3813
1939-9375
Abstract
An experimental setup has been developed to perform experiments on a planar, crossed electric and magnetic field or crossed-field (CF) device. The structure, which is 15 cm long and 10 cm wide with an anode-to-sole gap of 2 cm, can measure electron beam perturbation as a function of injected beam current and magnetic field. The applied maximum anode to sole voltage is 3 kV and the applied maximum magnetic field is 0.02 T. A beam-measurement system, which consists of an anode with eight segmented sections and nine segmented end collectors, is incorporated. Eight silicon-gated field emitter arrays (Si-GFEAs) are used for the electron source. For the experiment, 1.5 mA of injected current at 50-V pulse was used. Experimental results without an applied magnetic field and with a magnetic field with different tilts are compared with simulation results and 1-D theory. The experimental planar crossed-field configurations demonstrate electron stability thresholds in current density and magnetic field tilt that agree with theory and simulation.