학술논문

On the contribution of transfer admittance to external field coupling into shielded cables
Document Type
Conference
Source
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Electromagnetic compatibility - Seattle Electromagnetic Compatibility, 1999 IEEE International Symposium on. 1:206-211 vol.1 1999
Subject
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Admittance
Cable shielding
Power cables
Voltage
Coaxial cables
Electromagnetic coupling
Impedance
Electromagnetic compatibility
Uncertainty
Moment methods
Language
Abstract
The relevance of the transfer admittance in the coupling process of external electromagnetic fields into shielded cables is discussed. Methods for including the transfer impedance into EMC analysis are well-developed. But, there is still uncertainty, under which circumstances the transfer admittance becomes the more important characteristic cable parameter, that eventually determines the induced voltages and currents within the cable. Starting from the underlying concept of this study, analytical expressions for the induced voltages at the internal loads of the cable are derived. Finally, the contribution of both coupling parameters, the transfer admittance and the transfer impedance, is evaluated in an example.