학술논문

In Orbit Programming and SEE characterization of the Microchip RT PolarFire® FPGA Fabric
Document Type
Conference
Source
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2021 21th European Conference. :1-6 Sep, 2021
Subject
Aerospace
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Protons
Single event latchup
Programming
Ions
Orbits
Fabrics
Transceivers
Single-Event Effects
FPGA
SONOS
Language
ISSN
1609-0438
Abstract
Microchip Radiation Tolerant (RT) PolarFire Field Programmable Gate Array (FPGA) fabric in orbit programming is investigated using Total Ionizing Dose (TID), Proton and Heavy ion in beam programming tests. In beam programming results show that in orbit programming can be achieved and programming must be followed by stand-alone verify to ensure programming success. Single Event Effect (SEE) characterization of the FPGA Fabric and Single Event Latchup (SEL) using heavy ion and proton are also presented.