학술논문
Heavy Ion and Proton Induced Single Event Effects on Microchip RT PolarFire FPGA
Document Type
Conference
Author
Source
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2020 20th European Conference on. :1-4 Oct, 2020
Subject
Language
ISSN
1609-0438
Abstract
The Single-Event response of Microchip 28 nm RT PolarFire SONOS-based FPGA is characterized using heavy ion and 64 MeV proton. The SONOS configuration cell is SEU immune due to the SONOS technology and the design of the configuration cell of RT PolarFire FPGA.