학술논문

Zero-Birefringence Silicon Waveguides Based on Tilted Subwavelength Metamaterials
Document Type
Periodical
Source
IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 11(5):1-8 Oct, 2019
Subject
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Refractive index
Optical waveguides
Photonics
Gratings
Nanowires
Optical device fabrication
Zero-birefringence waveguides
polarization independence
anisotropy engineering
sub-wavelength grating (SWG)
silicon-on-insulator (SOI).
Language
ISSN
1943-0655
1943-0647
Abstract
Polarization independent silicon-on-insulator nanowires are highly sought after, due the inherent high birefringence of this material platform. State-of-the-art designs of non-birefringent waveguides include ridge waveguides and square nanowires, which either imply large dimensions, multiple etching steps, low fabrication tolerances or high wavelength dependence. In this work, we overcome all the aforementioned limitations through tilted subwavelength structures which provide anisotropy control of the resulting metamaterial. With a waveguide cross section of only 300 nm × 550 nm (height × width), the zero-birefringence point is obtained for an approximately $48^\circ$-tilt of the subwavelength structure. Birefringence of the nominal design deteriorates by only $9.10^{-3}$ even in the presence of size deviations of $\pm$10 nm. Moreover, birefringence is maintained under $6.10^{-3}$ in a 100-nm bandwidth around the central wavelength of 1550 nm. This innovative approach is readly adaptable to a wide range of waveguide sizes, while maintaining single-etch-step fabrication.