학술논문
Optimizing test systems for operational test benefits using parallel test capable instruments
Document Type
Conference
Author
Source
2008 IEEE AUTOTESTCON AUTOTESTCON, 2008 IEEE. :499-503 Sep, 2008
Subject
Language
ISSN
1088-7725
1558-4550
1558-4550
Abstract
In the past operational testing has either been too expensive or to complex to offer return on investment sufficient to justify developing a general purpose automatic test system (ATS). A small change in the way one traditionally thinks about tester/TPS development opens the door to increased return on investment in ATS equipment and ATS programs.