학술논문
All-Pass NGD FIR Original Study for Sensor Failure Detection Application
Document Type
Periodical
Author
Source
IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 70(9):9561-9571 Sep, 2023
Subject
Language
ISSN
0278-0046
1557-9948
1557-9948
Abstract
This article deals with original design, implementation, test, and potential application of finite impulse response (FIR) with uncommon all-pass negative group delay (AP-NGD) circuit. The counterintuitive AP-NGD numerical circuit theory is established. The design method of first-order AP-NGD circuit is introduced with respect to the specified time-advance. The first-order difference equation was synthesized, designed, and implemented in STM32 Microcontroller Unit, and experimented to validate the AP-NGD characteristics. The AP-NGD FIR prototype was tested in the time-domain with Gaussian and arbitrary waveform sensored signals. Calculated and experimented results in very good agreement with the most significant time-advance −10 s ever experimented before are obtained. The potential industrial application of the NGD predictor for sensor fault diagnosis in real-time is described.