학술논문
Integrating Machine-Learning Probes in FPGA CAD: Why and How?
Document Type
Periodical
Author
Source
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(5):7-14 Oct, 2023
Subject
Language
ISSN
2168-2356
2168-2364
2168-2364
Abstract
This article discusses challenges posed by current designs and proposes the adoption of machine-learning probes in the FPGA design flow to improve performance.