학술논문

Performance analysis of monolithically integrated depletion-/enhancement-mode InAlN/GaN heterostructure HEMT transistors
Document Type
Conference
Source
2017 International Conference on Applied Electronics (AE) Applied Electronics (AE), 2017 International Conference on. :1-4 Sep, 2017
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Inverters
Current measurement
Semiconductor device measurement
Logic gates
D-HEMTs
InAlN/GaN Heterostructure
Monolithic integration
HEMT transistor
Digital inverter
Language
Abstract
The paper addresses a top-down design flow of depletion-load digital inverter formed by monolithically integrated depletion-mode and enhancement-mode high electron mobility transistors (HEMTs) on common InAlN/GaN heterostructure grown on sapphire substrate. We describe the inverter design at transistor level using HSPICE models developed earlier. The inverter layout representation, which also defines the lithographic masks required for the fabrication process, is presented as well. The proposed mask set was designed taking into account the design-for-manufacturing approach. Furthermore, we evaluated measured properties and performance of the fabricated transistors and circuits and recalibrate the transistor models according to the latest measurements.