학술논문

USA interlaboratory comparison of superconductor simulator critical current measurements
Document Type
Periodical
Source
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 5(2):548-551 Jun, 1995
Subject
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Critical current
Current measurement
Circuit simulation
Laboratories
Particle measurements
NIST
Measurement uncertainty
Pulse measurements
Electronic circuits
Voltage
Language
ISSN
1051-8223
1558-2515
2378-7074
Abstract
An interlaboratory comparison of critical current (I/sub c/) measurements was conducted on the superconductor simulator, which is an electronic circuit that emulates the extremely nonlinear voltage-current characteristic of a superconductor. These simulators are high precision instruments, and are useful for establishing the integrity of part of a superconductor measurement system. This study includes measurements from participating US laboratories, with NIST as the central, organizing laboratory. This effort was designed to determine the sources of uncertainty in I/sub c/ measurements due to uncertainties in the measurement apparatus, technique, or the analysis system. The participating laboratories measured the superconductor simulator with a variety of methods including DC and pulse. This comparison indicated the presence of systematic biases and higher variability at low voltages in the I/sub c/ determinations of the measurement systems. All critical current measurements at a criterion of 10 /spl mu/V on the I/sub c/ simulator were within 2% of the NIST value for nominal critical currents of 2 and 50 A. These results could significantly benefit superconductor measurement applications that require high-precision quality assurance.ETX