학술논문

A new gate-level body biasing technique for PMOS transistors in subthreshold CMOS circuits
Document Type
Conference
Source
2005 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 2005 IEEE International Symposium on. :4697-4700 Vol. 5 2005
Subject
Components, Circuits, Devices and Systems
Communication, Networking and Broadcast Technologies
Engineered Materials, Dielectrics and Plasmas
MOSFETs
Circuits
Language
ISSN
0271-4302
2158-1525
Abstract
Subthreshold operation enables CMOS circuits to operate using very low supply voltages and to dissipate extremely low power with moderate performance. The dynamic threshold MOS technique (DTMOS) is an effective way to improve subthreshold circuit performance. In this paper, we propose a new body biasing technique for PMOS transistors working in the subthreshold region. In the proposed PMOS body biasing technique, the n-wells of PMOS transistors are biased with the gate output. The new technique improves circuit performance over DTPMOS and consumes less power. Simulations done using 0.18 /spl mu/m CMOS technology show that the proposed technique improves a 3-input AND gate speed by 40.1% and has a 82.3% energy-delay-product (EDP) savings over the DTPMOS scheme at 0.37 V supply voltage and 2 MHz operating frequency.