학술논문

Post-Process Removal of Spurious Fabry-PÉrot Oscillations Caused by Cleaved Waveguide-Ends
Document Type
Periodical
Source
Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 27(5):500-510 Mar, 2009
Subject
Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Optical waveguides
Optical resonators
Optical scattering
Optical devices
Ultrafast optics
Optical waveguide components
Optical waveguide theory
Silicon on insulator technology
Optical coupling
Interference
Fabry–PÉrot resonators
optical waveguide components
silicon on insulator technology
scattering matrices
Language
ISSN
0733-8724
1558-2213
Abstract
Testing of integrated (guided-wave) optical component that uses cleaved facets for input/output coupling has to deal with spurious Fabry-PÉrot cavity effects that can interfere heavily with observation and measurement of the behavior of the device. This paper demonstrates a technique that takes advantage of such interference for the reconstruction of the complete characteristics of a generic component. By studying a theoretical model of the system, a post-process computational tool is developed and verified through numerical testing. Starting from a single transmittance data set, the amplitude and phase of the transmission and reflection coefficients are reconstructed with considerable accuracy. Initial experimental testing demonstrates consistency in reconstructing the behavior of a real device.