학술논문

Demonstration and analysis of a 40-gigasample/s interferometric analog-to-digital converter
Document Type
Periodical
Source
Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 24(3):1247-1256 Mar, 2006
Subject
Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Analog-digital conversion
Optical noise
Noise measurement
Phase measurement
Optical interferometry
Signal to noise ratio
Sampling methods
Encoding
Signal resolution
Phase detection
Analog–digital conversion
electrooptical modulation
optical interferometry
phase modulation
photonic analog-to-digital converter (ADC)
photonic sampling
Language
ISSN
0733-8724
1558-2213
Abstract
A novel interferometric scheme for photonic analog-to-digital conversion is for the first time experimentally demonstrated at a real-time sample rate of 40 gigasamples/s. The scheme includes sampling as well as binary encoding, and the input signal in the experiment was a 1.25-GHz sinusoidal tone that was successfully digitized with a nominal resolution of 21 digital levels. Single-sample measurements yielded an effective number of bits (ENOB) of 2.6, which was limited by thermal detection noise while multisample averaged measurements resulted in an ENOB of 3.6 bits, mainly limited by phase drift. Apart from the experimental results, this paper covers an extensive theoretical analysis of the system, including calculations on the fundamental maximum bandwidth, the required optical power, the generated binary code, and its error robustness, as well as the impact of detection noise on the signal-to-noise ratio of the digitized signal. The major benefits of this interferometric scheme are that only one standard phase modulator is required and that the phase swing does not have to be larger than /spl plusmn//spl pi/ to reach the full digital value space.