학술논문

A zero dead-time front-end channel in 28 nm CMOS for future high energy physics detectors
Document Type
Conference
Source
IEEE EUROCON 2023 - 20th International Conference on Smart Technologies Smart Technologies, IEEE EUROCON 2023 - 20th International Conference on. :128-132 Jul, 2023
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Geoscience
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Fabrication
High energy physics
Circuit simulation
Data acquisition
Prototypes
Detectors
CMOS technology
Front-end electronics
28 nm CMOS
Future HEP experiments
zero dead-time
Language
Abstract
This work discusses the design of analog front-end circuits for future, high-rate pixel detector applications. In particular, the paper describes the in-pixel flash ADC, featuring a novel, clocked comparator conceived to dramatically reduce the threshold dispersion of the front-end. The paper includes a description of the front-end channel blocks, together with the discussion of the main analog performance parameters, as obtained from circuit simulations and including equivalent noise charge and threshold dispersion. The design is carried out in the framework of the INFN Falaphel project.