학술논문
Fault identification in analog-discrete circuits using general-purpose analysis programs
Document Type
Conference
Author
Source
1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196) Electronics, circuits and systems Electronics, Circuits and Systems, 1998 IEEE International Conference on. 1:495-498 vol.1 1998
Subject
Language
Abstract
An approach to fault identification in analog-discrete (SC and SI) circuits is proposed using test measurement data in discrete-time points. The determination of the changed parameter values of the faulty elements is accomplished by a single direct current analysis of a suitable nonlinear identification resistance model. Models of the basic structural elements, as well as the way of the whole identification model construction, are defined. An example considering the SC-circuit fault identification using the PSpice simulator is presented.