학술논문

Doping mechanism of helium-based plasma
Document Type
Conference
Source
2014 20th International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2014 20th International Conference on. :1-4 Jun, 2014
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Helium
Atomic measurements
Plasmas
Boron
Doping
Radiation effects
Ions
plasma doping
knock-on
ultra shallow
Language
Abstract
The mechanism of helium-based plasma doping (He-PD) was investigated. It is found out for the first time that the mechanism is that dopant atoms are knocked-on by a huge number of helium atoms, born out by the results of experiments of helium plasma irradiation following the ultra-low energy implantations. Boron and phosphorous atoms are knocked-on to the almost same depth. Arsenic ions are also evaluated and deeper depth doping than boron and phosphorous is observed. Additionally, it is not necessarily the case that the profile by the He-PD shows steeper abruptness than conventional ion implantation but it is limited to the low power condition. The moving distance by helium irradiation does not depend on atom mass but it correlates linearly to the atom radius. Large atoms such as arsenic moves more than smaller atoms like boron and phosphorous.