학술논문

An Overview of Spread Spectrum Time Domain Reflectometry Responses to Photovoltaic Faults
Document Type
Periodical
Source
IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 10(3):844-851 May, 2020
Subject
Photonics and Electrooptics
Circuit faults
Impedance
Photovoltaic systems
Time-domain analysis
Degradation
Wires
Accelerated degradation faults (ADF)
arc faults (AF)
bypass diode faults (BDF)
connection faults (CF)
degradation
ground faults (GF)
open-circuit (OC) faults
photovoltaic (PV) cells
reflectometry
shading faults
short-circuit (SC) faults
spread spectrum time domain reflectometry (SSTDR)
Language
ISSN
2156-3381
2156-3403
Abstract
Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.