학술논문
Thermal degradation of relaxor-based piezoelectric ceramics
Document Type
Conference
Author
Source
[Proceedings] 1990 IEEE 7th International Symposium on Applications of Ferroelectrics Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on. :459-462 1990
Subject
Language
Abstract
The effect of exposure to elevated temperatures on dielectric and piezoelectric properties near the morphotropic phase boundary is examined, and the mechanisms of thermal degradation involved as compared to normal ferroelectric materials are discussed. The thermal degradation of dielectric and piezoelectric properties was investigated for relaxor ferroelectric compositions in the (1-x)Pb(Mg/sub 1/3/Nb/sub 2/3/)O/sub 3/-(x)PbTiO/sub 3/ family near the morphotropic phase boundary. Degradations of the radial coupling factor piezoelectric charge coefficient and mechanical quality factor were observed to be less than expected based on the temperature dependence of the polarization.ETX