학술논문
Long term reverse annealing in silicon detectors
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 41(4):791-795 Aug, 1994
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
The methods of isothermal and isochronal heat treatments have been used for further studies of the reverse annealing effect of the effective impurity concentration. These measurements lead to an improved reliability of a second order model, which was already proposed in earlier works. Using only three parameters this model can predict the time dependence of the effective impurity concentration in a wide range of neutron fluences and temperature.ETX