학술논문

Correction to "Broad-band injected-beam crossed-field amplifiers"
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 24(6):775-775 Jun, 1977
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Loss measurement
Skin
Conductors
Tungsten
Surface cracks
Surface waves
Scanning electron microscopy
Language
ISSN
0018-9383
1557-9646