학술논문
Delay defect screening using process monitor structures
Document Type
Conference
Source
22nd IEEE VLSI Test Symposium, 2004. Proceedings. VLSI test symposium VLSI Test Symposium, 2004. Proceedings. 22nd IEEE. :43-48 2004
Subject
Language
ISSN
1093-0167
Abstract
This paper presents delay test data collected from test chips fabricated in a 0.18 /spl mu/ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency.