학술논문
Electrooptic mapping of a MESFET interdigitated structure
Document Type
Conference
Source
1999 29th European Microwave Conference Microwave Conference, 1999. 29th European. 2:69-71 Oct, 1999
Subject
Language
Abstract
The electric field above a MESFET has been measured using electrooptic sampling. The measurements show the electric field distribution above the interdigitated structure to be asymmetric, suggesting an unbalanced distribution of the amplification between the fingers. This result is just one example of how electrooptic sampling can detect problems inside a device not detectable using traditional vector network analyser techniques.