학술논문
High-Sensitivity Optically Modulated Scatterer for Electromagnetic-Field Measurement
Document Type
Periodical
Author
Source
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 56(2):486-490 Apr, 2007
Subject
Language
ISSN
0018-9456
1557-9662
1557-9662
Abstract
The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application.