학술논문
Probes for a scanning near-field optical microscope on the base tapered single-mode optical fiber
Document Type
Conference
Author
Source
Proceedings of CAOL'2003. 1st International Conference on Advanced Optoelectronics and Lasers. Jontly with 1st Workshop on Precision Oscillations in Electronics and Optics (IEEE Cat. No.03EX715) Advanced optoelectronics and lasers Advanced Optoelectronics and Lasers, 2003. Proceedings of CAOL 2003. First International Conference on. 2:36-38 vol.2 2003
Subject
Language
Abstract
Probes for a scanning near-field optical microscope on the base a single-mode adiabatically tapered optical fiber have been fabricated by the chemical etching only. The transmission coefficient of light in this probes is 2-3 order magnitude higher than that of mechanical pulled fibres probes. The probes may be used for green (/spl lambda/=0.48-0.55 /spl mu/m), red (0.60-0.68 /spl mu/m) and near infrared (0.78-1.05 /spl mu/m) wavelength ranges the reason of this effect is explained. Probe of the scanning near-field optical microscope on the base microstrip line is proposed.