학술논문
Study of bipolar transistor matching at high current level with various test configurations leading to a new model approach
Document Type
Conference
Author
Source
Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Biopolar/BiCMOS Circuits and Technology Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the. :62-65 2005
Subject
Language
ISSN
1088-9299
2378-590X
2378-590X
Abstract
Matching of bipolar transistors has been characterized for high currents. The predominant impact of access resistance mismatch is clearly demonstrated, and matching models are suggested. Moreover, matching results dependency on test configurations is studied.