학술논문

Solving Electromagnetic Scattering Contribution from Each Component Region with HO-SIE-DDM Solver
Document Type
Conference
Source
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Electromagnetic Compatibility (APEMC), 2022 Asia-Pacific International Symposium on. :533-535 Sep, 2022
Subject
Fields, Waves and Electromagnetics
Integral equations
Electromagnetic scattering
Electromagnetic compatibility
Numerical models
Dielectrics
Matrix decomposition
Coatings
Domain decomposition method (DDM)
discontinuous Galerkin
higher order hierarchical vector (HOHV) basis functions
surface integral equation (SIE)
component electromagnetic flow
scattering contribution
Language
ISSN
2640-7469
Abstract
In this paper, a surface integral equation (SIE) method based on the global solution of the method of moments (MoM) is developed for the analysis of the contribution of component electromagnetic flow to the overall metallic target. In this SIE, the whole target is divided into several different sub-regions by using the idea of domain decomposition (DD). Then, on the basis of the current coefficient matrix obtained by MoM, this SIE method can calculate the contribution value generated by electromagnetic flows on each component region from the sub-region by marking and partitioning the target. Moreover, two technologies are further adopted to enhance the efficiency and flexibility of this SIE method. One is that curved triangular elements and higher order hierarchical vector (HOHV) basis functions are applied, which can remarkably reduce the unknown amount of the conventional SIE. The other is that a DD method is adopted to employ a discontinuous Galerkin (DG) approach to glue conformal/ nonconformal surface grids between adjacent subdomains. It is obvious that this HO-SIE based on DDM can further increase the flexibility of geometrical modeling and accelerate the convergence of the HO-SIE for electrically large and multiscale metallic targets. Finally, two numerical results are given to demonstrate the validity of this method.