학술논문

Robust Design of Bimetallic ZnO Nanofilm SPR Sensor using Taguchi Method
Document Type
Conference
Source
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Photonics and Electrooptics
Power, Energy and Industry Applications
Reflectivity
Gold
Silver
II-VI semiconductor materials
Zinc oxide
Robustness
Time-domain analysis
Taguchi method
Surface plasmon resonance
SPR
ZnO
bimetallic sensor
Urea
Language
Abstract
Taguchi’s L9 static design was employed to determine the robust design of a zinc oxide (ZnO) nanofilm surface plasmon resonance (SPR) bimetallic sensor. The control factors such as incident wavelength and different thicknesses of silver, gold and ZnO layers were selected. Noise factors include thickness of the chromium layer and the diameter of the biomolecules (i.e. urea) which were simulated using Finite-Difference-Time-Domain (FDTD). Results obtained show that the thickness of the gold layer has a 41.32% dominant factor effect on the minimum reflectance of light $(\mathbf{R}_{\mathbf{min}})$, whereas the incident wavelength has a 73.15% dominant factor effect on the full-width-at-half-maximum (FWHM) of the SPR signal. The confirmation tests carried out show that the values of $\mathbf{R}_{\mathbf{min}}$ and FWHM were optimized using Taguchi's orthogonal array method leading to a robust design of the SPR sensor.