학술논문

A 13Bit 5GS/S ADC with Time-Interleaved Chopping Calibration in 16NM FinFET
Document Type
Conference
Source
2018 IEEE Symposium on VLSI Circuits VLSI Circuits, 2018 IEEE Symposium on. :99-100 Jun, 2018
Subject
Components, Circuits, Devices and Systems
Calibration
1f noise
Very large scale integration
FinFETs
Bandwidth
Photomicrography
Clocks
ADC
time-interleaving
digital calibration
chopping and flicker noise
Language
Abstract
A 13bit 5GS/s time-interleaved ADC is described which uses a chopping technique to reduce the effect of interleaved flicker noise spectral artefacts and to increase the ADC immunity to input signal characteristics. Enhanced offset and time-skew calibration algorithms are developed to maximize the performance in the presence of non-ideal sampling switches. At 5GS/s, the ADC dissipates 641mW while achieving a 62dB and 57dB of SFDR and SNDR respectively while maintaining a SFDR excluding HD2 and HD3 better than 70dBc across the first Nyquist band for input amplitudes down to −20dBFS.