학술논문

A 1 V Bandgap Reference in 7-nm FinFET with a Programmable Temperature Coefficient and an Inaccuracy of ±0.2% from −45°C to 125°C
Document Type
Conference
Source
ESSCIRC 2018 - IEEE 44th European Solid State Circuits Conference (ESSCIRC) European Solid State Circuits Conference (ESSCIRC), ESSCIRC 2018 - IEEE 44th. :78-81 Sep, 2018
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
General Topics for Engineers
Power, Energy and Industry Applications
Temperature measurement
Voltage measurement
Photonic band gap
Field programmable gate arrays
FinFETs
Voltage control
Computer architecture
Language
Abstract
A 1-V precision voltage reference in 7-nm FinFET CMOS is presented. It allows to control a temperature coefficient of the generated voltage. Proposed trim techniques, favored for short test times, help to achieve good accuracy in spite of the challenges posed by the scaled technology and a ‘hostile’ SoC environment. Two 2nd-order curvature compensation techniques are implemented to achieve high accuracy. Measurement results show a max inaccuracy of ±0.2% with temperature coefficient as low as ~6ppm/° C over temperature range of 170° C (−45° C to 125° C). Furthermore, the temperature coefficient is digitally programmable between −7mV/100°C to +8mV/100°C, thus enabling temperature compensation for various sub-blocks within an FPGA. Line regulation is 0.1%.V. The whole design occupies 0.078 mm 2 .