학술논문
Microstructural Engineering of the Near-UV Photocurrent Production in VO2 Thin Film Based Detectors
Document Type
Conference
Source
2018 IEEE Photonics Conference (IPC) Photonics Conference (IPC), 2018 IEEE. :1-2 Sep, 2018
Subject
Language
ISSN
2575-274X
Abstract
Vanadium Dioxide is a strongly correlated material that can exhibit photoelectric properties via substrate-film hole transfer. We study these photoelectric properties in epitaxially grown VO2 thin films under near UV-light on various substrates, namely TìO2(001), and TiO2:Nb in development of new, fast UV photodetectors.