학술논문
A Multiscale Statistical Evaluation of DRAM Variable Retention Time
Document Type
Conference
Author
Source
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2021 5th IEEE. :1-3 Apr, 2021
Subject
Language
Abstract
This paper presents a multiscale physics-based approach for evaluating DRAM cell retention time including variable retention time effects. The flow goes from ab-initio DFT simulation to high-sigma SPICE analysis, allowing for the evaluation of the causes and retention time related failure states for DRAM technologies.