학술논문

Experimental verification of timing measurement circuit with self-calibration
Document Type
Conference
Source
19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2014 19th International. :1-6 Sep, 2014
Subject
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Signal Processing and Analysis
Delays
Calibration
Histograms
Ring oscillators
Linearity
Clocks
Time-to-Digital Converter
Time Measurement
Self-Calibration
Histogram Method
FPGA
Language
Abstract
This paper describes the architecture, implementation and measurement results for a Time-to-Digital Converter (TDC), with histogram-method self-calibration, for high-speed I/O interface circuit test applications. We have implemented the proposed TDC using a Programmable System-on-Chip (PSoC), and measurement results show that TDC linearity is improved by the self-calibration. All TDC circuits, as well as the self-calibration circuits can be implemented as digital circuits, even by using FPGA instead of full custom ICs, so this is ideal for fine CMOS implementation with short design time.