학술논문
A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 44(6):1981-1988 Dec, 1997
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of an initial test for dose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate. For parts with adequate design margin and/or well behaved parts a generic elevated temperature irradiation test is proposed.