학술논문

Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering Technique
Document Type
Periodical
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):895-901 Apr, 2024
Subject
Nuclear Engineering
Bioengineering
Photonic band gap
Threshold voltage
Resistors
Transient analysis
Switches
Perturbation methods
Transistors
Bandgap reference
radiation-hardened-by-design (RHBD)
single-event transient (SET)
Language
ISSN
0018-9499
1558-1578
Abstract
Bandgap is a critical block for numerous electronic systems, which provides stable voltage reference for multiple submodules over process, voltage supply, and temperature (PVT) fluctuations. This article first proposes a radiation-hardened-by-design (RHBD) technique, which can automatically detect single-event transient (SET) disturbances and convert them into nanosecond-scale alternating signals, which can then be easily filtered by an ON-chip filter. Theoretically, this technique can reduce SET amplitude to a negligible level regardless of bandgap structure and the output dc voltage. Laser experiments indicate that the SET pulse amplitude can be reduced from 896 to 48 mV under 800-pJ laser strike. This technique provides new guidance for SET mitigation on constant dc voltage and is widely applicable for bandgap radiation-hardening design.