학술논문

A System for Simultaneous Application of Uniaxial Strain and Electric Field to the Crystal Sample in Wide Temperature Range for X-Ray Scattering Experiments
Document Type
Conference
Source
2021 International Conference on Electrical Engineering and Photonics (EExPolytech) Electrical Engineering and Photonics (EExPolytech), 2021 International Conference on. :146-148 Oct, 2021
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Photonics and Electrooptics
Signal Processing and Analysis
Temperature measurement
Temperature distribution
X-ray scattering
Tensile strain
Photonic crystals
X-ray diffraction
Uniaxial strain
Uniaxial Strain
X-Ray Scattering
Crystal Sample
Language
Abstract
The sample cell for the single crystal X-ray diffraction measurements under simultaneous application of the controllable uniaxial tensile strain and electric field in a wide temperature range is described. The details of the cell design are discussed. Test diffraction measurements were performed with 0.67PbMg 1/3 Nb 2/3 O 3 -0.33PbTiO 3 (0.67PMN-0.33PT) single crystal. The sample had platelet shape thinned in central part. Here we present experimental results, acquired with a new system.