학술논문

MBE-Grown MgO Thin Film Vacuum Ultraviolet Photodetector With Record High Responsivity of 3.2 A/W Operating at 400 °C
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(5):913-916 May, 2024
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Films
Thermal stability
Photodetectors
Dark current
Temperature measurement
Molecular beam epitaxial growth
Photonic band gap
MgO
MBE
vacuum ultraviolet photodetector
high-temperature
Language
ISSN
0741-3106
1558-0563
Abstract
In this work, a high performance vacuum ultraviolet (VUV) photodetector (PD) based on MgO thin film has been fabricated and characterized from room temperature to 400 °C for the first time. At 25 °C, the device exhibits a low dark current of 100 fA, a large VUV/UVC rejection ratio of over 104, a high responsivity of 0.865 A/W under 185 nm illumination, and a short response time of $1.25~\mu \text{s}$ at the bias of 20 V. The excellent thermal stability has also been demonstrated even at high temperature up to 400 °C, exhibiting a record-high responsivity (3.2 A/W), a maintained quick response speed ( $1.25~\mu \text{s}$ ) and a large VUV/UVC rejection ratio (103), which is obviously better than any other reported VUV detectors based on ultra-wide bandgap semiconductors. Additionally, this MgO PD demonstrates exceptional repeatability and long-term operating stability at both room temperature and elevated temperature. These findings underscore the outstanding performance of the MgO VUV PD, rendering it highly suitable for demanding operational conditions.