학술논문

Heat-resistance study of thermal release tape
Document Type
Conference
Source
2013 8th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2013 8th International. :35-38 Oct, 2013
Subject
Components, Circuits, Devices and Systems
Heating
Vehicles
Three-dimensional displays
Market research
Films
Joining processes
IEEE catalog
Language
ISSN
2150-5934
2150-5942
Abstract
Thermal release tape is an unique tape that has three layers structure, including adhesive layer — base film and thermal release layer. These tapes behave like adhesive tape at room temperature but can be easily removed by heating at high temperature when we want to release this tape[1, 2]. Because these tapes are available in rolls for all automatic or manual wafer mounting systems, thermal release tape is widely applied in semiconductor package industry. In this paper, heat-resistance of thermal release tape were studied under some thermal conditions, such as (Y−30)°C/3hr–(Y−20)°C/3hr–(Y−10)°C/3hr and Y°C/3hr and we examine foaming phenomenon of tape. These results show that tape will lose fully foaming ability and become more difficultly to be released after long time heating on high temperature.