학술논문

MLC PCM Techniques to Improve Nerual Network Inference Retention Time by 105X and Reduce Accuracy Degradation by 10.8X
Document Type
Conference
Source
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Subject
Bioengineering
Computing and Processing
Photonics and Electrooptics
Power, Energy and Industry Applications
Degradation
Resistance
Phase change materials
Weight measurement
Neural networks
Bit error rate
Measurement uncertainty
Language
ISSN
2158-9682
Abstract
We present three novel MLC PCM techniques – (1) device requirement balancing, (2) prediction-based MSB-biased referencing, and (3) bit-prioritized placement to address the MLC device challenges in neural network applications. Using measured MLC bit error rates, the proposed techniques can improve the MLC PCM retention time by 10 5 times while keeping the ResNet-20 inference accuracy degradation within 3% and reduce the accuracy degradation by 91% (10.8X) for CIFAR-100 dataset in the presence of temporal resistance drift.