학술논문

Exploring the PSO-Driven Test Pattern Generation Approach for Hardware Trojan Detection
Document Type
Conference
Source
2024 IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI) Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI), 2024 IEEE International Conference on. 2:1-6 Mar, 2024
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Technological innovation
Runtime
Circuits
Hardware
Vectors
Space exploration
Trojan horses
Hardware Trojan
Test Generation
Particle Swarm Optimization
VLSI
Language
Abstract
Hardware Trojans (HT) refer to tiny circuits that adversaries implant for malicious purposes. These circuits operate stealthily and, once triggered, can lead to severe disruptions. Detecting their presence requires the application of suitable test vectors. However, a huge search space often complicates the test generation task. In this regard, evolutionary algorithms are promising candidates due to their ability to explore such search space with effective test vectors. This paper introduces a test generation methodology that effectively utilizes the capabilities inherent in particle swarm optimization (PSO) to successfully attain its intended objectives. The validity of the proposed approach is confirmed by applying it to multiple ISCAS ’85 benchmark circuits. The results show a significant reduction in test generation time, exceeding 50%, alongside an enhancement in test set quality compared to the current state-of-the-art techniques.