학술논문

Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond

Document Type

Periodical

Author

Huang, K.; Liu, Y.; Korolija, N.; Carulli, J.M.; Makris, Y.

Source

IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 41(2):15-22 Apr, 2024

Subject

Computing and Processing
Components, Circuits, Devices and Systems
Integrated circuits
Degradation
Principal component analysis
Manufacturing
Integrated circuit modeling
Training
Field programmable gate arrays
Recycling
Hardware
Statistical analysis
Network systems
Recycled+IC+detection<%2Fitalic>%22">Recycled IC detection
statistical+learning+methods<%2Fitalic>%22">statistical learning methods
IC+parametric+test<%2Fitalic>%22">IC parametric test

Language

ISSN

2168-2356
2168-2364

Abstract

This article summarizes the current approaches in using statistical methods to identify recycled hardware, including IC, FPGA, memories, and network components. —Gang Qu, University of Maryland, USA

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

이메일

부산대학교 도서관

Online Access

메일 발송