학술논문

Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Document Type

Conference

Author

O'Bryan, Martha V.; LaBel, Kenneth A.; Buchner, Stephen P.; Ladbury, Ray L.; Poivey, Christian F.; Oldham, Timothy R.; Campola, Michael J.; Carts, Martin A.; Berg, Melanie D.; Sanders, Anthony B.; Mackey, Susan R.

Source

2008 IEEE Radiation Effects Data Workshop Radiation Effects Data Workshop, 2008 IEEE. :11-20 Jul, 2008

Subject

Fields, Waves and Electromagnetics
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Nuclear Engineering
Protons
CMOS integrated circuits
Temperature measurement
NASA
Testing
Semiconductor device measurement
Laser beams

Language

ISSN

2154-0519
2154-0535

Abstract

We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

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