학술논문

Compendium of SEE and TID Test Results for DDR4 SDRAM memories
Document Type
Conference
Source
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2022 22nd European Conference on. :1-8 Oct, 2022
Subject
Aerospace
Components, Circuits, Devices and Systems
Nuclear Engineering
Photonics and Electrooptics
Robotics and Control Systems
Signal Processing and Analysis
Space missions
Europe
SDRAM
Total ionizing dose
Single Event Effects
Total Ionizing Dose
Components
Memories
DDR4
Language
ISSN
1609-0438
Abstract
This paper reports the results and analysis of single event effects (SEE) tests and total ionizing dose (TID) on DDR4-SDRAM memories. The compendium covers five DDR4-SDRAM references from different manufactures tested in the frame of CNES studies.