학술논문
Single Event Effects Testing of a Commercial-Off-The-Shelf Analog-To-Digital Converter in a Camera Application
Document Type
Conference
Source
2016 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2016 IEEE. :1-3 2016
Subject
Language
Abstract
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test results showcase application-specific results for the commercial part in its intended application.