학술논문

Reliability of Heterogeneous Integration on Hybrid Substrate With Ajinomoto Build-Up Film
Document Type
Conference
Source
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :542-547 May, 2023
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Photonics and Electrooptics
Integrated circuits
Dielectric materials
Multichip modules
Metals
Electronic components
Dielectrics
Reliability
Ajinomoto build-up film
fan-out
chip-last
temporary panel
hybrid substrate
organic interposer
2.3D IC integration
Language
ISSN
2377-5726
Abstract
The hybrid substrate (build-up package substrate + organic interposer + solder joints + underfill) of 2.3D IC integration (or multiple systems and heterogeneous integration) is investigated. The organic interposer of the hybrid substrate is fabricated by a fan-out chip-last on a temporary panel with two different kinds of dielectric materials, namely the PID (photoimageable dielectric) and the ABF (Ajinomoto Build-Up Film). These two hybrid substrates are supporting two chips. The flatness of metal lines of the RDLs (redistribution-layers), the quality of the hybrid substrate after chip-to-hybrid substrate bonding, and the reliability of the solder joints between these two hybrid substrates will be presented.