부산대학교 도서관

Measurements performed on a population of electronic devices reveal part-to-part variation due to manufacturing process variation. Corner models are a useful tool for the designers to bound the effect of this variation on circuit performance. To accurately simulate the circuit level behavior, compact model parameters for devices within a circuit must be calibrated to experimental data. However, determination of the bounding data for corner model calibration is difficult, primarily because available tolerance bound calculation methods only consider variability along one dimension and, do not adequately consider the variabilities across both the current and voltage axes. This paper presents the demonstration of a novel functional data analysis approach to generate tolerance bounds on these two types of variability separately and these bounds are then transformed to be used in corner model calibration.