학술논문
Total ionizing dose effects in a SRAM-based FPGA
Document Type
Conference
Source
1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Radiation effects data workshop Radiation Effects Data Workshop, 1999. :24-29 1999
Subject
Language
Abstract
We have measured the effects of total ionizing dose on Xilinx XC4036X FPGAs. The FPGAs were irradiated at a dose rate of about, 0.5 krad/hr. An average total dose of 39 krad(Si) and 16 krad(Si) were absorbed by the XL-series and XLA-series FPGAs, respectively, before the power supply current increased.