학술논문
Proton radiation effects in XC4036XLA field programmable gate arrays
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 50(2):263-271 Apr, 2003
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
We have measured the proton-induced single-event upset (SEU) cross section of Xilinx XC4036XLA field programmable gate arrays. The threshold energy for SEU was determined to be (22/spl plusmn/2) MeV. The upset cross section saturated at a value of (2.7/spl plusmn/0.2)/spl times/10/sup -9/ cm/sup 2//device. We have demonstrated that Bendel models are unable to describe the upset cross section. The effects of the radiation environment of the liquid argon calorimeter of the ATLAS detector on the XC4036XLA were estimated.