학술논문

Exploration of Power Device Reliability Using Compact Device Models and Fast Electrothermal Simulation
Document Type
Periodical
Source
IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 44(3):894-903 Jun, 2008
Subject
Power, Energy and Industry Applications
Signal Processing and Analysis
Fields, Waves and Electromagnetics
Components, Circuits, Devices and Systems
Electrothermal effects
Temperature
Power system modeling
Power system reliability
Insulated gate bipolar transistors
P-i-n diodes
Hybrid electric vehicles
Table lookup
Vehicle driving
Materials reliability
Compact modeling
electrothermal simulation
mission profile
power semiconductor devices
rainflow cycle counting
reliability
thermal cycling
Language
ISSN
0093-9994
1939-9367
Abstract
This paper presents the application of compact insulated gate bipolar transistor and p-i-n diode models, including features such as local lifetime control and field-stop technology, to the full electrothermal system simulation of a hybrid electric vehicle converter using a lookup table of device losses. The vehicle converter is simulated with an urban driving cycle (the Federal Urban Driving Schedule), which is used to generate transient device temperature profiles. A methodology is also described to explore the converter reliability using the temperature profile, with rainflow cycle counting techniques from material fatigue analysis. The effects of ambient temperature, driving style, and converter design on converter reliability are also investigated.