학술논문
Radiation damage studies of a custom-designed VLSI readout chip
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 35(1):166-170 Feb, 1988
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
Two structurally similar versions of an NMOS custom VLSI circuit, fabricated by different manufacturers, have been irradiated with a /sup 60/Co source up to doses of 100 krad. Large differences in their behavior after irradiation have been seen and are thought to be due to the fabrication processes. These differences are observed in test structure measurements and overall chip performance. An increase in circuit noise causes one version of the chip to be unusable after radiation doses of 20 krad.ETX