학술논문
Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators
Document Type
Conference
Author
Source
2017 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2017 IEEE. :1-21 Jul, 2017
Subject
Language
ISSN
2154-0535
Abstract
This data compendium reports single event transient (SET) and total ionizing dose (TID) test results for commonly used commercial-off-the-shelf (COTS) and radiation hardened voltage comparators targeted for possible use in space-based missions. Interesting trends in the variability of the radiation performance of these devices due to differences in lot date codes, manufacturers, circuit design, and test conditions are analyzed herein.